Facilities: characterization techniques
IMM research activity relies on the following characterization techniques and tools:
- Structural characterization: AFM, RX
- Electrical characterization: Hall effect, I-V, C-V
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Optical characterization:
— Photoluminescence (PL) and confocal µPL at low temperatures (370-2300 nm, 4.2-300 K)
— Time resolved PL and confocal µPL <100 ps (400-1800 nm, 4.2-300 K)
— PL and confocal µPL at high magnetic fields up to 9 Tesla (370-2300 nm, 4.2-300 K)
— Single photon correlation spectroscopy (HBT setup)
— Spectral elipsometry
— Scanning Near-field Optical Microscopy (SNOM)
— Absorption and modulation spectroscopy -
Magneto-optical characterization:
— Magneto-optical spectrometry in polar and transverse configurations
— Hysteresis loops in polar and transverse configurations
— Magneto-optical torque - Plasmonic interferometry
- Magneto-plasmonic characterization in Kretschmann configuration
- Magnetic Force Microscopy (MFM)
- Characterization of NEMS and MEMS
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